International Test Technologies will Present in the Non-Traditional Test Techniques/Alternative Test Methods Session at EtroniX 2001

by Anonymous

Norwalk, CT – February 7, 2001 – Billy Fenton, VP Engineering & CTO, of International Test Technologies will present a paper entitled “Using Microprocessor and DSP Debug Interfaces for Manufacturing Functional Test and Diagnosis” in the Non-traditional Test Techniques/Alternative Test Methods session in the EvaluTech Conference at EtroniX 2001. The session will take place on Wednesday, February 28, 2001 from 1:00pm – 4:00pm.

This paper will discuss how an alternative test technique improves test development, improving time-to-market in both manufacturing and field service. Many microprocessors and DSP manufacturers now include debug interfaces, which are intended to simplify board hardware and software development. Although aimed at design engineers, test engineers can exploit these interfaces to implement functional test solutions, with reduced development times, improved diagnostic resolution, and shorter test times.

EtroniX 2001 is produced and managed by the Electronics Group of Reed Exhibition Companies (REC). EtroniX will be held February 25 – March 1, 2001 in Anaheim, California.

For more information or to register by phone, contact customer service at 1-800-467-5656 or 1-203-840-5656. Or visit the EtroniX web site at www.etronixexpo.com.